Ahmadi, M. V., and M. Doostparast. 2021. Evaluating the lifetime performance index of products based on pro-aggressively Type-II censored Pareto samples: A new Bayesian approach. Quality and Reliability Engineering Q3 International doi:10.1002/qre.3040.
Golosnoy, V. and Liesenfeld, R. 2011. Interval shrinkage estimators, J. Appl. Stat. 38, 465-477.
Hong, C. W., J. W. Wu, and C.-H. Cheng. 2007. Computational procedure of performance assessment of lifetime index of businesses for the Pareto lifetime model with the right type II censored sample. Applied Mathematics and Computation 184 (2):336–50. Doi: 10.1016/j.amc.2006.05.199.
J. Shaabani & A. A. Jafari. 2022. Inference on the lifetime performance index of gamma distribution: point and interval estimation, Communications in Statistics - Simulation and Computation, DOI: 10.1080/03610918.2022.2045498.
Lee, W. C. 2010. Assessing the lifetime performance index of gamma lifetime products in the manufacturing industry. Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture 224 (10):1571–9. Doi:10.1243/09544054JEM1783
Lee, W. C. 2011. Inferences on the lifetime performance index for Weibull distribution based on censored observations using the max p-value method. International Journal of Systems Science 42:931–7. doi:10.1080/00207720903260168.
Lee, W. C., J. W. Wu, and C. W. Hong. 2009. Assessing the lifetime performance index of products from progressively type II right censored data using Burr XII model. Mathematics and Computers in Simulation 79: 2167–79. Doi: 10.1016/j.matcom.2008.12.001.
Montgomery, D. C. 1985. Introduction to statistical quality control. John Wiley & Sons.
Thompson, J. R. 1968. Accuracy borrowing in the estimation of the mean by shrinkage to an interval, J. Amer. Statist. Assoc., 63, 953-963.
Nasiri, P., Ebrahimi, F. 2022. Interval Shrinkage Estimation Reliability System of Stress-Strengths
Models in two parameter Lindley distribution. Mathematical Researches, 8 (1), 72-88
Tong, L. I., K. S. Chen, and H. T. Chen. 2002. Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution. International Journal of Quality & Reliability Management 19 (7):812–24. doi:10.1108/02656710210434757.